Estimation of parameters of “smaz” images in the closed contours of management of optoelectronic systems

Traditionally it is considered that “smaz” the images, defining accuracy of measurement of co-ordinates of objects and so forth, depends on the external factor defined by turbulence of atmosphere, in the final width of the diagram of an orientation of the reception aerial of system of support and so forth However at short circuit of contours of management of systems of support the amplitude of “smaz” images can exceed several times amplitude of “smaz”, arising because of the external factor. In article the estimation of parameters of "smaz" the image arising in closed contours of management of optoelectronic systems is resulted. The received results can be useful at the analysis and synthesis of the closed systems using accumulation of a picture signal.