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<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "https://jats.nlm.nih.gov/publishing/1.3/JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xml:lang="en">
  <front>
    <journal-meta>
      <journal-title-group>
        <journal-title>Computing, Telecommunication and Control</journal-title>
        <trans-title-group xml:lang="ru">
          <trans-title>Информатика, телекоммуникации и управление</trans-title>
        </trans-title-group>
      </journal-title-group>
      <issn pub-type="epub">2687-0517</issn>
    </journal-meta>
    <article-meta>
      <article-id pub-id-type="publisher-id">28</article-id>
      <title-group>
        <article-title>Investigation of the degradation reasons of GAASP photoemitters</article-title>
        <trans-title-group xml:lang="ru">
          <trans-title>Комплексная диагностика GAASP - фотоэмиттеров</trans-title>
        </trans-title-group>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <name>
            <surname>Filimonov</surname>
            <given-names>Alexey</given-names>
          </name>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Bondarenko</surname>
            <given-names>Vyacheslav</given-names>
          </name>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Korablev</surname>
            <given-names>Vadim</given-names>
          </name>
          <email>korablev@spbcas.ru</email>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Koroleva</surname>
            <given-names>Ekaterina</given-names>
          </name>
        </contrib>
      </contrib-group>
      <pub-date publication-format="electronic" date-type="pub" iso-8601-date="2008-04-10">
        <day>10</day>
        <month>04</month>
        <year>2008</year>
      </pub-date>
      <issue>2</issue>
      <issue-id pub-id-type="publisher-id">55</issue-id>
      <fpage>148</fpage>
      <lpage>154</lpage>
      <abstract xml:lang="en">
        <p>The target of the given study is to carry out an investigation on processes taking place into the subsurface region of semiconductor cathodes by means of ion and electron spectroscopy theoretically and in a set of experiments.</p>
      </abstract>
    </article-meta>
  </front>
</article>
